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Keilmann, Fritz, Dr.

Munich-Centre for Advanced Photonics
Munich-Centre for Advanced Photonics
Am Coulombwall 1
85748 Garching, Germany
Phone: + 49 89 289-14088 (-14106 lab)
Fax: + 49 98 289-14141
http://www.attoworld.de/sharedPages/People/KeilmannFritz/KeilmannFritz.html
Research Focus
Infrared near-field microscopy, frequency-comb spectroscopy, metamaterials.
Honours
Kenneth J Button
prize 2009
Scientific curriculum
1961-1967 Study of meteorology and physics, München, Diplom thesis on microwave spectroscopy of hemoglobin
1970 Dr. rer. nat. Technische Hochschule München, Thesis on plasma diagnostics with infrared lasers
1970-1971 Max-Planck-Institut für Plasmaphysik, Garching, Infrared ion temperature measurement in Tokamak
1972-1973 Massachusetts Institute of Technology, Cambridge, USA (A. Javan) Precision frequency measurement, optically pumped lasers, saturation spectroscopy of gases
1973-1995 Max-Planck-Institut für Festkörperforschung, Stuttgart, Nonlinear far-infrared spectroscopy, phonon spectroscopy, biological microwave effects, semiconductor physics, optics
1987 Visiting Scientist University of California in Santa Barbara, USA, Free electron laser, nonlinear spectroscopy
1995-2007 Max-Planck-Institut für Biochemie, Martinsried, Scanning near-field microscopy, infrared spectroscopy, biophysics
2008-present Max-Planck-Institut für Quantenoptik, Garching, Broadband-infrared near-field microscopy
Recent publications
Sergiu Amarie, Thomas Ganz, and Fritz Keilmann, Mid-infrared near-field spectroscopy, Optics Express 17, 21794 (2009)
T. Ganz, M. Brehm, H.G.v. Ribbeck, D.W.v.d. Weide, and F. Keilmann, Vector frequency-comb Fourier-transform spectroscopy for characterizing metamaterials, New Journal of Physics 10 (2008) 123007 (14pp).
A.J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, THz near-field nanoscopy of mobile carriers in single semiconductor nanodevices, Nano Lett., 2008, 8 (11), pp 3766–3770 and
Nature.
M. Brehm, A. Schliesser, F. Čajko, I. Tsukerman, and F. Keilmann, Antenna-mediated back-scattering efficiency in infrared near-field microscopy. Opt. Express 16, 11203 (2008).
M.M. Qazilbash, M. Brehm, B.-G. Chae, P.-C. Ho, G.O. Andreev, B.-J. Kim, S. J. Yun, A.V. Balatsky, M.B. Maple, F. Keilmann, H.-T. Kim, and D.N. Basov, Mott transition in VO2 revealed by infrared spectroscopy and nano-imaging. Science 318, 1750 (2007).
