Munich-Centre for Advanced Photonics

Keilmann, Fritz, Dr.

Fritz Keilmann

Munich-Centre for Advanced Photonics

Munich-Centre for Advanced Photonics
Am Coulombwall 1

85748 Garching, Germany

Phone: + 49 89 289-14088 (-14106 lab)
Fax: + 49 98 289-14141

http://www.attoworld.de/sharedPages/People/KeilmannFritz/KeilmannFritz.html

 fritz.keilmann(at)mpq.mpg.de

 

Research Focus

Infrared near-field microscopy, frequency-comb spectroscopy, metamaterials.

Honours

Kenneth J Button Öffnet externen Link in neuem Fensterprize 2009

Scientific curriculum

1961-1967    Study of meteorology and physics, München, Diplom thesis on microwave spectroscopy of hemoglobin
1970            Dr. rer. nat. Technische Hochschule München, Thesis on plasma diagnostics with infrared lasers
1970-1971    Max-Planck-Institut für Plasmaphysik, Garching, Infrared ion temperature measurement in Tokamak
1972-1973    Massachusetts Institute of Technology, Cambridge, USA (A. Javan) Precision frequency measurement, optically pumped lasers, saturation spectroscopy of gases
1973-1995    Max-Planck-Institut für Festkörperforschung, Stuttgart, Nonlinear far-infrared spectroscopy, phonon spectroscopy, biological microwave effects, semiconductor physics, optics
1987            Visiting Scientist University of California in Santa Barbara, USA, Free electron laser, nonlinear spectroscopy
1995-2007    Max-Planck-Institut für Biochemie, Martinsried, Scanning near-field microscopy, infrared spectroscopy, biophysics
2008-present Max-Planck-Institut für Quantenoptik, Garching, Broadband-infrared near-field microscopy

Recent publications

Sergiu Amarie, Thomas Ganz, and Fritz Keilmann, Mid-infrared near-field spectroscopy, Optics Express 17, 21794 (2009)

T. Ganz, M. Brehm, H.G.v. Ribbeck, D.W.v.d. Weide, and F. Keilmann, Vector frequency-comb Fourier-transform spectroscopy for characterizing metamaterials, New Journal of Physics 10 (2008) 123007 (14pp).

A.J. Huber, F. Keilmann, J. Wittborn, J. Aizpurua, and R. Hillenbrand, THz near-field nanoscopy of mobile carriers in single semiconductor nanodevices, Nano Lett., 2008, 8 (11), pp 3766–3770 and Öffnet externen Link in neuem FensterNature.

M. Brehm, A. Schliesser, F. Čajko, I. Tsukerman, and F. Keilmann, Antenna-mediated back-scattering efficiency in infrared near-field microscopy. Opt. Express 16, 11203 (2008).

M.M. Qazilbash, M. Brehm, B.-G. Chae, P.-C. Ho, G.O. Andreev, B.-J. Kim, S. J. Yun, A.V. Balatsky, M.B. Maple, F. Keilmann, H.-T. Kim, and D.N. Basov, Mott transition in VO2 revealed  by infrared spectroscopy and nano-imaging. Science 318, 1750 (2007).

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